Investigation of changes in the paramets of thin films structures during ion implantation
In this paper were investigated the change of parameters of structures of thin film during ion implantation. Thickness of thin films before and after ion implantation were investigated by X-ray reflectivity. Also, crystal structure, average crystallite size and lattice constant were investigated by X-ray diffraction. The possibility ...
Optimization of the thin film Heusler alloys formation technique by the method of Pulsed laser deposition
... B. et al. Direct measurements of field-induced adiabatic temperature changes near compound phase transitions in Ni-Mn-In based Heusler alloys // Appl. Phys. Let. 2011. № 98. P. 131 911.
Grunin A., Lyatun I., Ershov P., Rodionova V., Goikhman A.
thin films, Heusler alloys, pulsed laser deposition
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